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Amit Suratkar

Head IT Department of Information Technology · Symbiosis International University

https://researchid.co/amitsuratkar
@siu.edu.in
8Scopus Publications

Research Interests

Integration of Technologies, Information Science, Data Modeling,

Education

Ph.D. Optical Science and Engineering M.S. Electrical Engineering B.E. Electronics Engineering

Recent Scopus Publications

  1. Absolute thickness measurement of silicon wafer using wavelength scanning interferometer
    Proceedings of SPIE the International Society for Optical Engineering, 2011
  2. Reflectometry-based wavelength scanning interferometry for thickness measurements of very thin wafers
    Optics Express, 2010
  3. Interferometric technique for faceted microstructure metrology using an index matching liquid
    Applied Optics, 2010
  4. Absolute length (thickness) measurements using wavelength scanning interferometry
    Proceedings of the 23rd Annual Meeting of the American Society for Precision Engineering Aspe 2008 and the 12th Icpe, 2008
  5. Uncertainty analysis on the absolute thickness of a cavity using a commercial wavelength scanning interferometer
    Proceedings of SPIE the International Society for Optical Engineering, 2008

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